In-line examination of Si wafers & solar cells using high resolution X-ray imaging methods [Poster]

Por favor, use este identificador para citar o enlazar este ítem:http://uvadoc.uva.es/handle/10324/35204

Título

Autor

Congreso

17th Conference on Defects (DRIP XVII)

Año del Documento

2017

Documento Fuente

17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain

Patrocinador

Ministerio de Economía, Industria y Competitividad (Project BFU2014-53469P)

Nota

Póster

Version del Editor

Idioma

spa

URI

Derechos

openAccess

Collections

Files in this item

Nombre:

Tamaño:

4.427Mb

Formato:

Adobe PDF

Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivatives 4.0 International