Statistics

Total Visits

	Views
Simulación de imágenes de defectos intrínsecos en Silicio mediante microscopía electrónica	474

File Visits

	Downloads
TFM-G179.pdf	207

Select a period of time:

ViewsDownloads

Number of views in the range

	Views
Simulación de imágenes de defectos intrínsecos en Silicio mediante microscopía electrónica	45

Number of downloads in the range

	Downloads
TFM-G179.pdf	20

Views

	Views
March 2024	7
April 2024	10
May 2024	2
June 2024	8
July 2024	6
August 2024	4
September 2024	8

Download CSV file

Bar graph

Line graph

Number of downloads in the period of time

Downloads
March 2024

8
April 2024

1
May 2024

2
June 2024

0
July 2024

4
August 2024

3
September 2024

2
Download CSV file

Bar graph

Line graph

Top country views

	Views
United States	18
Singapore	10
Ireland	4
Russia	3
Spain	3
Australia	2
Switzerland	1
Colombia	1
Indonesia	1
Mexico	1

Top countries by downloads

	Downloads
United States	6
Spain	2
Mexico	2
Indonesia	1
Russia	1

Top cities views

	Views
Singapore	6
Madrid	3
Ashburn	2
Craiova	1
Inglewood	1
Jakarta	1
Melbourne	1
Pachuca	1
Palmira	1
Sydney	1

Top cities by downloads

	Downloads
Madrid	1
Ashburn	1
Jakarta	1
Pachuca	1