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Título
Electroluminescence imaging and light-beam induced current as characterization techniques of multi-crystalline si solar cells
Autor
Año del Documento
2018
Documento Fuente
Proceedings of the 35th European Photovoltaic Solar Energy Conference and Exhibition. DOI: 10.4229/35thEUPVSEC20182018-2DV.3.36
Résumé
There is an increasing demand for characterizing multicrystalline solar cells at different stages of its
service life. Luminescence techniques, e.g. electroluminescence (EL) and photoluminescence (PL), have acquired a paramount interest in the last years. These techniques are used in imaging mode, allowing to take a luminescence picture at a full wafer/cell scale. This imaging approach is fast and sensitive, but has a low spatial resolution, which avoids a detailed analysis of the defect distribution, which can led to misinterpretations about critical parameters as the minority carrier diffusion length, or the internal and external quantum efficiencies. If one complements these techniques with high spatial resolution techniques, such as light beam induced current (LBIC), one can study the electrical activity
of the defects at a micrometric scale, providing additional understanding about the role played by the defects in full wafer/cell luminescence images. The combination of the macroscopic and microscopic resolution scales is necessary for the analysis of the full luminescence images in mc-Si solar cells.
ISBN
3-936338-50-7
Patrocinador
Proyecto de Investigación ENE2014-56069-C4- 4-R (MCIN)
Proyecto de Investigación ENE2017-89561-C4-3-R (MCIN)
Junta de Castilla y León (Proyecto de Investigación VA081U16)
Proyecto de Investigación ENE2017-89561-C4-3-R (MCIN)
Junta de Castilla y León (Proyecto de Investigación VA081U16)
Idioma
eng
Tipo de versión
info:eu-repo/semantics/draft
Derechos
openAccess
Aparece en las colecciones
Fichier(s) constituant ce document
Tamaño:
1.135Mo
Formato:
Adobe PDF