TY  - CHAP 
AU  - Dueñas Carazo, Salvador
AU  - Castán Lanaspa, María Helena
PY  - 2018
SN  - 9781315150130
UR  - http://uvadoc.uva.es/handle/10324/44637
AB  - Capacitance studies of metal–oxide–semiconductor (MOS) capacitors have been used since the early 60s of the past century to investigates the interface surface states, oxide charge and electron and ion phenomena in these structures. This chapter...
LA  - eng
PB  - Jenny Stanford Publishing
KW  - Semiconductores de óxido metálico
TI  - Capacitance Spectroscopy for MOS Systems
ER  -