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Castán Lanaspa, María Helena (29)
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Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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SCIENTIFIC PRODUCTION
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Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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SCIENTIFIC PRODUCTION
Grupos de Investigación
Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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GCME - Artículos de revista
[25]
GCME - Capítulos de monografías
[1]
GCME - Comunicaciones a congresos, conferencias, etc.
[6]
Recent Submissions
Low-energy inference machine with multilevel HfO2 RRAM arrays
Milo, V.
;
Zambelli, Cristian
;
Olivo, P.
;
Pérez, Eduardo
;
González Ossorio, Óscar
;
Wenger, Christian
;
Ielmini, Daniele
(
2019
)
Effective reduction of the programing pulse width in Al: HfO2-based RRAM arrays
González Ossorio, Óscar
;
Pérez, Eduardo
;
Dueñas Carazo, Salvador
;
Castán Lanaspa, María Helena
;
García García, Héctor
;
Wenger, Christian
(
2019
)
Energy levels of defects created in silicon supersaturated with transition metals
García García, Héctor
;
Castán Lanaspa, María Helena
;
García Hemme, E.
;
García Hernansaz, R.
;
Montero, D.
;
González Díaz, G.
(
2018
)
Electrical characterization of defects created by γ-radiation in HfO2-based MIS structures for RRAM applications
García García, Héctor
;
González, M. B.
;
Mallol, M. M.
;
Castán Lanaspa, María Helena
;
Dueñas Carazo, Salvador
;
Campabadal Segura, Francesca
;
Acero, M. C.
;
Sambuco Salomone, L.
;
Faigón, A.
(
2018
)
Controlling the intermediate conductance states in RRAM devices for synaptic applications
García García, Héctor
;
González Ossorio, Óscar
;
Dueñas Carazo, Salvador
;
Castán Lanaspa, María Helena
(
2019
)
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