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dc.contributor.authorSouto Bartolomé, Jorge Manuel 
dc.contributor.authorPura Ruiz, José Luis 
dc.contributor.authorTorres, Alfredo
dc.contributor.authorJiménez López, Juan Ignacio 
dc.contributor.authorBettiati, Mauro
dc.contributor.authorLaruelle, Francois
dc.date.accessioned2016-12-15T12:35:28Z
dc.date.available2016-12-15T12:35:28Z
dc.date.issued2016
dc.identifier.citationMicroelectron. Reliability 64, 627 (1916)es
dc.identifier.issn0026-2714es
dc.identifier.urihttp://uvadoc.uva.es/handle/10324/21770
dc.descriptionProducción Científicaes
dc.description.abstractThe defects generated by the catastrophic optical degradation (COD) of high power laser diodes have been examined using cathodoluminescence (CL). Discontinuous dark lines that correspond to different levels of damage have been observed along the ridge. Finite element methods have been applied to solve a physical model for the degradation of the diodes that explicitly considers the thermal and mechanical properties of the laser structure. According to this model, the COD is triggered by a local temperature enhancement that gives rise to thermal stresses leading to the generation of dislocations. Damage is initially localized in the QW, and when it propagates to the waveguide layers the laser ends its life.es
dc.format.mimetypeapplication/pdfes
dc.language.isoenges
dc.publisherElsevieres
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectCathodoluminescencees
dc.titleCatastrophic optical damage of high power InGaAs/AlGaAs laser diodeses
dc.typeinfo:eu-repo/semantics/articlees
dc.identifier.doi10.1016/j.microrel.2016.07.038es
dc.relation.publisherversionhttp://www.journals.elsevier.com/microelectronics-reliability/es
dc.peerreviewedSIes
dc.description.projectJunta de Castilla y León (programa de apoyo a proyectos de investigación – Ref. VA302U13)es
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International


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