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    • DEP32 - Otros Documentos (Monografías, Informes, Memorias, Documentos de Trabajo, etc)
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    Por favor, use este identificador para citar o enlazar este ítem:http://uvadoc.uva.es/handle/10324/31273

    Título
    Spectroscopic analysis of optoelectronic semiconductors
    Autor
    Jiménez López, Juan IgnacioAutoridad UVA Orcid
    Tomm, Jens W.
    Serie
    Springer Series in Optical Sciences, V. 202
    Año del Documento
    2016
    Editorial
    Springer
    Descripción
    Producción Científica
    Resumo
    This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.
    Palabras Clave
    Semiconductores
    Técnicas espectroscópicas
    ISBN
    978-3-319-42349-4
    DOI
    10.1007/978-3-319-42349-4
    Version del Editor
    https://www.springer.com/la/book/9783319423470
    Propietario de los Derechos
    © Springer International Publishing
    Idioma
    eng
    URI
    http://uvadoc.uva.es/handle/10324/31273
    Derechos
    restrictedAccess
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    • DEP32 - Otros Documentos (Monografías, Informes, Memorias, Documentos de Trabajo, etc) [18]
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    Universidad de Valladolid

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