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dc.contributor.authorJiménez López, Juan Ignacio 
dc.contributor.authorTomm, Jens W.
dc.date.accessioned2018-08-28T10:38:43Z
dc.date.available2018-08-28T10:38:43Z
dc.date.issued2016
dc.identifier.isbn978-3-319-42349-4es
dc.identifier.urihttp://uvadoc.uva.es/handle/10324/31273
dc.descriptionProducción Científicaes
dc.description.abstractThis book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic techniques are introduced and their relationship to the standard techniques is revealed. Thus the book works also as a type of guide or reference book for people researching in optical spectroscopy of semiconductors.es
dc.format.mimetypeapplication/pdfes
dc.language.isoenges
dc.publisherSpringer
dc.relation.ispartofseriesSpringer Series in Optical Sciences, V. 202
dc.rights.accessRightsinfo:eu-repo/semantics/restrictedAccesses
dc.subject.classificationSemiconductoreses
dc.subject.classificationTécnicas espectroscópicases
dc.titleSpectroscopic analysis of optoelectronic semiconductorses
dc.typeinfo:eu-repo/semantics/bookes
dc.rights.holder© Springer International Publishinges
dc.identifier.doihttps://doi.org/10.1007/978-3-319-42349-4es
dc.relation.publisherversionhttps://www.springer.com/la/book/9783319423470es


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