| dc.contributor.author | Sánchez, L.A. | |
| dc.contributor.author | Moretón Fernández, Ángel | |
| dc.contributor.author | Guada, Miguel | |
| dc.contributor.author | Rodríguez Conde, Sofía | |
| dc.contributor.author | Martínez Sacristán, Óscar | |
| dc.contributor.author | González Rebollo, Miguel Ángel | |
| dc.contributor.author | Jiménez López, Juan Ignacio | |
| dc.date.accessioned | 2019-03-22T08:45:45Z | |
| dc.date.available | 2019-03-22T08:45:45Z | |
| dc.date.issued | 2017 | |
| dc.identifier.citation | 17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain | es |
| dc.identifier.uri | http://uvadoc.uva.es/handle/10324/35190 | |
| dc.description.abstract | Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal resolution using the Light-Beam Induced Current (LBIC) technique combined with a ELi - PLi system. | es |
| dc.format.mimetype | application/pdf | es |
| dc.language.iso | eng | es |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.title | High resolution LBIC characterization of defects in mc-Si solar cells [Poster] | es |
| dc.type | info:eu-repo/semantics/conferenceObject | es |
| dc.relation.publisherversion | http://drip17.org/home/ | es |
| dc.title.event | 17th Conference on Defects (DRIP XVII) | es |
| dc.description.other | Póster | |
| dc.description.project | Ministerio de Economía, Industria y Competitividad (ENE2014-56069-C4-4-R) | es |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International | |
Exceto quando indicado o contrário, a licença deste item é descrito como Attribution-NonCommercial-NoDerivatives 4.0 International