Mostrar el registro sencillo del ítem
| dc.contributor.author | Solórzano Quijano, Eusebio | |
| dc.contributor.author | Pérez Vasallo, Pablo | |
| dc.date.accessioned | 2019-03-22T14:09:57Z | |
| dc.date.available | 2019-03-22T14:09:57Z | |
| dc.date.issued | 2017 | |
| dc.identifier.citation | 17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain | es |
| dc.identifier.uri | http://uvadoc.uva.es/handle/10324/35204 | |
| dc.format.mimetype | application/pdf | es |
| dc.language.iso | spa | es |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.title | In-line examination of Si wafers & solar cells using high resolution X-ray imaging methods [Poster] | es |
| dc.type | info:eu-repo/semantics/conferenceObject | es |
| dc.relation.publisherversion | http://drip17.org/home/ | es |
| dc.title.event | 17th Conference on Defects (DRIP XVII) | es |
| dc.description.other | Póster | |
| dc.description.project | Ministerio de Economía, Industria y Competitividad (Project BFU2014-53469P) | es |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International |
Ficheros en el ítem
Este ítem aparece en la(s) siguiente(s) colección(ones)
La licencia del ítem se describe como Attribution-NonCommercial-NoDerivatives 4.0 International