ListarGrupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME) por tema
Materia |
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Semantic segmentation [2] |
Semiconductor device measurement [1] |
Semiconductores de óxido metálico [1] |
Semiempirical model [1] |
Series resistance [1] |
Set/reset processes [2] |
Silicio [1] |
Silicon [1] |
Silicon oxide [1] |
Simulation [1] |
Social networking (online) [1] |
spectroscopic ellipsometry [1] |
Stacked nanostructures [1] |
Stochastic variability [1] |
Switches [1] |
Switching [1] |
Synaptic devices [2] |
Ta2O5:ZrO2 ALD films [1] |
Tantalum oxide [1] |
tantalum oxide [1] |