Browsing Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME) by Subject
Set/reset processes [2] |
Silicio [1] |
Silicon [1] |
Silicon oxide [1] |
Simulation [1] |
Social networking (online) [1] |
spectroscopic ellipsometry [1] |
Stacked nanostructures [1] |
Stochastic variability [1] |
Switches [1] |
Switching [1] |
Synaptic devices [2] |
Ta2O5:ZrO2 ALD films [1] |
Tantalum oxide [1] |
tantalum oxide [1] |
TCM [1] |
Temperature characterization [1] |
Temperature measurement [1] |
thermal dependence [1] |
thickness dependence [1] |