ListarGrupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME) por tema
Materia |
---|
convolutional neural network [1] |
crystal structure [1] |
Current control [1] |
Current control mode (CCM) [1] |
Data models [1] |
Data retention [1] |
Deep learning [3] |
deep learning [1] |
Deposición atómica de capas [7] |
Deposición de capa atómica [2] |
Deposición de capas atómicas [1] |
Deposition [1] |
Depression [1] |
device modeling;non-volatile memory [1] |
Diafragmas piezoeléctricos [1] |
Dielectric properties [1] |
dielectric properties [1] |
Dielectrics [1] |
Digital twin [1] |
Dispositivos sinápticos [2] |