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    AuthorCastán Lanaspa, María Helena (6)Dueñas Carazo, Salvador (6)Kukli, Kaupo (6)
    Tamm, Aile (6)
    Kalam, Kristjan (5)... View MoreDate Issued
    2018 (6)
    Formatoapplication/pdf (6)... View More
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    •   UVaDOC Home
    • SCIENTIFIC PRODUCTION
    • Grupos de Investigación
    • Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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    •   UVaDOC Home
    • SCIENTIFIC PRODUCTION
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    • Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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    Memory maps : Reading RRAM devices without power consumption 

    Dueñas Carazo, SalvadorAutoridad UVA; Castán Lanaspa, María HelenaAutoridad UVA; Kukli, Kaupo; Mikkor, Mats; Kalam, Kristjan; Arroval, T.; Tamm, Aile (2018)
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    Resistive switching properties of atomic layer deposited ZrO2-HfO2 thin films 

    González Ossorio, ÓscarAutoridad UVA; Dueñas Carazo, SalvadorAutoridad UVA; Castán Lanaspa, María HelenaAutoridad UVA; Tamm, Aile; Kalam, Kristjan; Seemen, Helina; Kukli, Kaupo (2018)
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    The role of defects in the resistive switching behavior of Ta2O5-TiO2-based metal–insulator–metal (MIM) devices for memory applications 

    Dueñas Carazo, SalvadorAutoridad UVA; Castán Lanaspa, María HelenaAutoridad UVA; García García, HéctorAutoridad UVA; González Ossorio, ÓscarAutoridad UVA; Domínguez, Leidy Azucena; Seemen, Helina; Tamm, Aile; Kukli, Kaupo; Aarik, Jaan (2018)
    Thumbnail

    Atomic layer deposition and properties of ZrO2/Fe2O3 thin films 

    Kalam, Kristjan; Seemen, Helina; Ritslaid, Peeter; Rähn, Mihkel; Tamm, Aile; Kukli, Kaupo; Kasikov, Aarne; Link, Joosep; Stern, Raivo; Dueñas Carazo, SalvadorAutoridad UVA; Castán Lanaspa, María HelenaAutoridad UVA; García García, HéctorAutoridad UVA (2018)
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    Properties of atomic layer deposited nanolaminates of zirconium and cobalt oxides 

    Seemen, Helina; Rähn, Mihkel; Kalam, Kristjan; Sajavaara, Timo; Dueñas Carazo, SalvadorAutoridad UVA; Castán Lanaspa, María HelenaAutoridad UVA; Link, Joosep; Stern, Raivo; Kukli, Kaupo; Tamm, Aile (2018)
    Thumbnail

    Electric and magnetic properties of atomic layer deposited ZrO2-HfO2 thin films 

    Kalam, Kristjan; Seemen, Helina; Mikkor, Mats; Ritslaid, Peeter; Stern, Raivo; Dueñas Carazo, SalvadorAutoridad UVA; Castán Lanaspa, María HelenaAutoridad UVA; Tamm, Aile; Kukli, Kaupo (2018)

    Universidad de Valladolid

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