DuMond analysis of bending in single crystals by Laue diffraction using [sigma]-[pi] polarization geometry

Título

dc.contributor.author	Serrano Gutiérrez, Jorge
dc.date.accessioned	2024-01-30T11:44:45Z
dc.date.available	2024-01-30T11:44:45Z
dc.date.issued	2008
dc.identifier.citation	J. Appl. Cryst. (2008). 41, 1053-1056	es
dc.identifier.uri	https://uvadoc.uva.es/handle/10324/65303
dc.description.abstract	A DuMond analysis of X-ray diffraction patterns has been carried out in the case of a combined [sigma]-[pi] polarization configuration, obtained using a setup with a double-crystal monochromator in reflection (Bragg) geometry and an analyser in transmission (Laue) geometry. The derived analytical expressions allow the characterization of the bending of the analyser and the quantitative estimation of the curvature radius and its sign from the width of the crystal rocking curves. The theoretical analysis is applied to the case of a thin, accidentally bent, Si crystal.	es
dc.format.mimetype	application/pdf	es
dc.language.iso	eng	es
dc.publisher	International Union of Crystallography	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.title	DuMond analysis of bending in single crystals by Laue diffraction using [sigma]-[pi] polarization geometry	es
dc.type	info:eu-repo/semantics/article	es
dc.identifier.doi	10.1107/S0021889808029981	es
dc.peerreviewed	SI	es
dc.description.project	CICYT	es
dc.description.project	Generalitat de Catalunya	es
dc.type.hasVersion	info:eu-repo/semantics/publishedVersion	es