Mostra Item 

Por favor, use este identificador para citar o enlazar este ítem:https://uvadoc.uva.es/handle/10324/82074

Título
Circuits and codes implemented for paper "Developing AI-Resilient Assessments: A Case Study with Electric Circuits" IEEE Global Engineering Education Conference (EDUCON) 2026.
Autor
Director o Tutor
Año del Documento
2026
Tipología
Otros
Abstract
Circuits and codes implemented for paper "Developing AI-Resilient Assessments: A Case Study with Electric Circuits" IEEE Global Engineering Education Conference (EDUCON) 2026. **Usage Rights:** These codes can be used freely by citing the author and the indicated article. How to cite: Ramón J. Durán Barroso et al., "Developing AI-Resilient Assessments: A Case Study with Electric Circuits," IEEE Global Engineering Education Conference (EDUCON), 2026. Funding: This work was carried out within the framework of PID 64 (2025/26), funded by the Vice-Rectorate for Teaching Innovation and Digital Transformation of the Universidad de Valladolid.
Departamento
Departamento de Teoría de la Señal y Comunicaciones e Ingeniería Telemática
Nivel Educativo
Enseñanzas universitarias
Propietario de los Derechos
Ramón José Durán Barroso
Idioma
eng
URI
https://uvadoc.uva.es/handle/10324/82074
Derechos
openAccess
Aparece en las colecciones
Mostra tutti i dati dell'item
Files in questo item
Tamaño:
53.80Kb
Formato:
application/octet-stream
Descripción:
Codes implemented for paper "Developing AI-Resilient Assessments: A Case Study with Electric Circuits" IEEE Global Engineering Education Conference (EDUCON) 2026.
Thumbnail
Mostra/Apri
Tamaño:
881.8Kb
Formato:
application/zip
Descripción:
Circuits used for paper "Developing AI-Resilient Assessments: A Case Study with Electric Circuits" IEEE Global Engineering Education Conference (EDUCON) 2026.
Mostra/Apri