ListarPRODUCCIÓN CIENTÍFICA por tema "Electrical characterization"

Mostrando ítems 1-3 de 3

Effects of the voltage ramp rate on the conduction characteristics of HfO2-based resistive switching devices

Aguirre, F L; González, M B; Jiménez-Molinos, F; Campabadal, F; Roldán, J B; Miranda, E; Castán Lanaspa, María Helena ; Dueñas Carazo, Salvador ; García García, Héctor ; García-Ochoa, E.; Vinuesa Sanz, Guillermo (2023)
Resistive switching properties of atomic layer deposited ZrO2-HfO2 thin films

González Ossorio, Óscar ; Dueñas Carazo, Salvador ; Castán Lanaspa, María Helena ; Tamm, Aile; Kalam, Kristjan; Seemen, Helina; Kukli, Kaupo (2018)
Study of the set and reset transitions in HfO2-based ReRAM devices using a capacitor discharge

García García, Héctor ; Vinuesa Sanz, Guillermo ; González Ossorio, Óscar ; Sahelices Fernández, Benjamín ; Castán Lanaspa, María Helena ; Dueñas Carazo, Salvador ; Bargalló González, Mireia; Campabadal Segura, Francesca (2021)