Photoluminescence imaging of solar grade mc-Si wafers and solar cells as a tool for efficiency qualification
13th EXMATEC ‐ Expert Evaluation and Control of Compound Semiconductor Materials and Technologies.
Año del Documento
13th EXMATEC ‐ Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, Aveiro, Portugal, 06 - 10 Jun 2016
The photoluminescence imaging (PLi) technique allows for the fast qualification of mc-Si wafers and solar cells, giving information of the presence and distribution of carrier capture centres, which obviously affect the final efficiencies. In this work, we characterize a wide collection of solar cells by PLi, correlating some aspects extracted from the PL images to their efficiencies. The desired goal of this approach is to provide a tool allowing a robust prediction of solar cell efficiency from the PL images of the wafers.
Ministerio de Economía, Industria y Competitividad (Project ENE2014- 56069-C4-4-R)
40th WOCSDICE ‐ Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe & 13th EXMATEC ‐ Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, 6-10 June 2016, Aveiro, Portugal
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