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dc.contributor.authorDudeck, Karleen J.
dc.contributor.authorMarqués Cuesta, Luis Alberto 
dc.contributor.authorKnights, Andrew P.
dc.contributor.authorGwilliam, Russell M.
dc.contributor.authorBotton, Gianluigi A.
dc.date.accessioned2018-03-13T09:02:44Z
dc.date.available2018-03-13T09:02:44Z
dc.date.issued2013
dc.identifier.citationPhysical Review Letters, 2013, Vol. 110, 166102es
dc.identifier.issn0031-9007es
dc.identifier.urihttp://uvadoc.uva.es/handle/10324/28963
dc.descriptionProducción Científicaes
dc.description.abstractn this Letter we present the detailed, quantitative comparison between experimentally and theoretically derived structures of the extended {311} defect in silicon. Agreement between experimental and theoretical column positions of better than ±0.05  nm has been achieved for all 100 atomic columns in the defect structure. This represents a calculated density of 5.5×1014 silicon interstitials per cm2 on {311} planes, in agreement with previous work [S. Takeda, Jpn. J. Appl. Phys., Part 2, 30, L639 (1991)]. We show that although the {311} defect is made up of five-, six-, seven-, and eight-member rings, the shape of these rings varies as a function of position along the defect, and these variations can be determined experimentally with high precision and accuracy. The excellent agreement between the calculated and experimentally derived structure, including the position of atomic columns and the shape of the distinct structural units of the defect, provides strong evidence for the quality and robustness of the molecular dynamics simulation approach for structural studies of defects. The experimental approach is straightforward, without the need for complicated image processing methods, and is therefore widely applicable.es
dc.format.mimetypeapplication/pdfes
dc.language.isoenges
dc.publisherAmerican Physical Societyes
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.classificationSilicones
dc.subject.classificationSilicioes
dc.titleSub-ångstrom Experimental Validation of Molecular Dynamics for Predictive Modeling of Extended Defect Structures in Sies
dc.typeinfo:eu-repo/semantics/articlees
dc.identifier.doihttps://doi.org/10.1103/PhysRevLett.110.166102es
dc.relation.publisherversionhttps://journals.aps.org/prl/abstract/10.1103/PhysRevLett.110.166102es
dc.peerreviewedSIes
dc.description.projectMinisterio de Ciencia e Innovación (Proyect TEC2011-27701)es
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International


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