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Acero, M.C. (2)

Castán Lanaspa, María Helena (2)

Dueñas Carazo, Salvador (2)

García García, Héctor (2)Bargalló González, Mireia (1)... View More Date Issued 2018 (1)2017 (1)Formato application/pdf (2)... View More

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Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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SCIENTIFIC PRODUCTION
Grupos de Investigación
Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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Electrical characterization of defects created by γ-radiation in HfO2-based MIS structures for RRAM applications

García García, Héctor

; Bargalló González, Mireia; Mallol, M. M.; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Campabadal Segura, Francesca; Acero, M. C.; Sambuco Salomone, L.; Faigón, A. (2018)

Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structures

García García, Héctor

; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; González, M.B.; Acero, M.C.; Campabadal, F. (2017)

Universidad de Valladolid

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