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Author Bargalló González, Mireia (2)

Campabadal Segura, Francesca (2)

Castán Lanaspa, María Helena (2)

Dueñas Carazo, Salvador (2)

García García, Héctor (2)... View More Date Issued

2018 (2)

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SCIENTIFIC PRODUCTION
Grupos de Investigación
Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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SCIENTIFIC PRODUCTION
Grupos de Investigación
Grupo de Caracterización de Materiales y Dispositivos Electrónicos (GCME)
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Analysis and control of the intermediate memory states of RRAM devices by means of admittance parameters

Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; García García, Héctor

; González Ossorio, Óscar

; Domínguez, Leidy Azucena; Sahelices Fernández, Benjamín

; Miranda, E.; Bargalló González, Mireia; Campabadal Segura, Francesca (2018)

Electrical characterization of defects created by γ-radiation in HfO2-based MIS structures for RRAM applications

García García, Héctor

; Bargalló González, Mireia; Mallol, M. M.; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Campabadal Segura, Francesca; Acero, M. C.; Sambuco Salomone, L.; Faigón, A. (2018)

Universidad de Valladolid

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