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| dc.contributor.author | Jimenez-Molinos, F. | |
| dc.contributor.author | Vinuesa, G. | |
| dc.contributor.author | García, H. | |
| dc.contributor.author | Tarre, A. | |
| dc.contributor.author | Tamm, A. | |
| dc.contributor.author | Kalam, K. | |
| dc.contributor.author | Kukli, K. | |
| dc.contributor.author | Dueñas Carazo, Salvador | |
| dc.contributor.author | Castán Lanaspa, María Helena | |
| dc.contributor.author | González, M.B. | |
| dc.contributor.author | Campabadal, F. | |
| dc.contributor.author | Maldonado, D. | |
| dc.contributor.author | Cantudo, A. | |
| dc.contributor.author | Roldán, J.B. | |
| dc.date.accessioned | 2024-02-13T15:44:22Z | |
| dc.date.available | 2024-02-13T15:44:22Z | |
| dc.date.issued | 2023 | |
| dc.identifier.citation | 2023 14th Spanish Conference on Electron Devices (CDE) | es |
| dc.identifier.isbn | 979-8-3503-0241-7 | es |
| dc.identifier.uri | https://uvadoc.uva.es/handle/10324/66235 | |
| dc.description | Producción Científica | es |
| dc.description.abstract | The thermal dependence of the resistance in the low resistance state of TiN/Ti/HfO 2 /Pt memristors has been experimentally studied. After modeling the measured I-V curves, the different resistive components (ohmic and non-linear) have been extracted and their thermal behavior estimated. Finally, the intrinsic series resistance linked to the metallic paths, contacts, and the remnants of the filament during resistive switching is also obtained at different temperatures. The results can be employed to propose physically-based models for circuit simulation. | es |
| dc.format.extent | 4 p. | es |
| dc.format.mimetype | application/pdf | es |
| dc.language.iso | eng | es |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE Xplore) | es |
| dc.rights.accessRights | info:eu-repo/semantics/restrictedAccess | es |
| dc.subject.classification | memristor | es |
| dc.subject.classification | thermal dependence | es |
| dc.subject.classification | resistive switching | es |
| dc.title | Thermal Dependence of the Resistance of TiN/Ti/HfO2/Pt Memristors | es |
| dc.type | info:eu-repo/semantics/conferenceObject | es |
| dc.identifier.doi | 10.1109/CDE58627.2023.10339514 | es |
| dc.relation.publisherversion | https://ieeexplore.ieee.org/document/10339514/metrics#metrics | es |
| dc.title.event | 2023 14th Spanish Conference on Electron Devices (CDE) | es |
| dc.description.project | Project B-TIC-624-UGR20 funded by the Consejería de Conocimiento, Investigación y Universidad, Junta de Andalucía (Spain) and the FEDER program. The study was also supported by the European Regional Development Fund project “Emerging orders in quantum and nanomaterials” (TK134), and the Estonian Research Agency (PRG753). M.B.G acknowledges the Ramón y Cajal grant No. RYC2020-030150-I | es |
| dc.type.hasVersion | info:eu-repo/semantics/publishedVersion | es |
