Skip navigation
Please use this identifier to cite or link to this item:
Title: Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes
Authors: Souto, Jorge
Pura, José Luis
Torres, A.
Jiménez López, Juan Ignacio
Bettiati, M.
Laruelle, F. J.
Issue Date: 2016
Publisher: Elsevier
Description: Producción Científica
Citation: Microelectron. Reliability 64, 627 (1916)
Abstract: The defects generated by the catastrophic optical degradation (COD) of high power laser diodes have been examined using cathodoluminescence (CL). Discontinuous dark lines that correspond to different levels of damage have been observed along the ridge. Finite element methods have been applied to solve a physical model for the degradation of the diodes that explicitly considers the thermal and mechanical properties of the laser structure. According to this model, the COD is triggered by a local temperature enhancement that gives rise to thermal stresses leading to the generation of dislocations. Damage is initially localized in the QW, and when it propagates to the waveguide layers the laser ends its life.
Keywords: Cathodoluminescence
ISSN: 0026-2714
Peer Review: SI
DOI: 10.1016/j.microrel.2016.07.038
Sponsor: Junta de Castilla y León (programa de apoyo a proyectos de investigación – Ref. VA302U13)
Publisher Version:
Language: eng
Rights: info:eu-repo/semantics/openAccess
Appears in Collections:DEP32 - Artículos de revista

Files in This Item:
File Description SizeFormat 
Microel_Rel_64_627_2016.pdf367,18 kBAdobe PDFThumbnail

This item is licensed under a Creative Commons License Creative Commons

University of Valladolid
Powered by MIT's. DSpace software, Version 5.5