Search

español
English
français
Deutsch
português (Brasil)
italiano

JavaScript is disabled for your browser. Some features of this site may not work without it.

Browse

All of UVaDOC Communities By Issue Date Authors Subjects Titles

My Account

Discover

Author Pelaz Montes, María Lourdes (3)Aboy Cebrián, María (2)López Martín, Pedro (2)Marqués Cuesta, Luis Alberto (2)Santos Tejido, Iván (2)... View More Date Issued

2010 (3)

Formato application/pdf (3)... View More

UVaDOC Home
SCIENTIFIC PRODUCTION
Grupos de Investigación
Electrónica
Electrónica - Artículos de revista
Search

UVaDOC Home
SCIENTIFIC PRODUCTION
Grupos de Investigación
Electrónica
Electrónica - Artículos de revista
Search

español
English
français
Deutsch
português (Brasil)
italiano

Search

Show Advanced Filters Hide Advanced Filters

Filters

Use filters to refine the search results.

Now showing items 1-3 of 3

Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100

Simulation of p-n junctions: Present and future challenges for technologies beyond 32 nm

Pelaz Montes, María Lourdes

; Marqués Cuesta, Luis Alberto

; Aboy Cebrián, María

; Santos Tejido, Iván

; López Martín, Pedro

; Duffy, Ray (2010)

Self-trapping in B-doped amorphous Si: Intrinsic origin of low acceptor efficiency

Santos Tejido, Iván

; Castrillo, P.; Windl, W.; Drabold, D. A.; Pelaz Montes, María Lourdes

; Marqués Cuesta, Luis Alberto

(2010)

Atomistic analysis of B clustering and mobility degradation in highly B-doped junctions

Aboy Cebrián, María

; Pelaz Montes, María Lourdes

; López Martín, Pedro

; Bruno, Elena; Mirabella, Salvo (2010)

Comentarios

Universidad de Valladolid

Powered by MIT's. DSpace software, Version 5.10