High resolution LBIC characterization of defects in mc-Si solar cells [Poster]

Título

dc.contributor.author	Sánchez, L.A.
dc.contributor.author	Moretón Fernández, Ángel
dc.contributor.author	Guada, Miguel
dc.contributor.author	Rodríguez Conde, Sofía
dc.contributor.author	Martínez Sacristán, Óscar
dc.contributor.author	González Rebollo, Miguel Ángel
dc.contributor.author	Jiménez López, Juan Ignacio
dc.date.accessioned	2019-03-22T08:45:45Z
dc.date.available	2019-03-22T08:45:45Z
dc.date.issued	2017
dc.identifier.citation	17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain	es
dc.identifier.uri	http://uvadoc.uva.es/handle/10324/35190
dc.description.abstract	Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal resolution using the Light-Beam Induced Current (LBIC) technique combined with a ELi - PLi system.	es
dc.format.mimetype	application/pdf	es
dc.language.iso	eng	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.title	High resolution LBIC characterization of defects in mc-Si solar cells [Poster]	es
dc.type	info:eu-repo/semantics/conferenceObject	es
dc.relation.publisherversion	http://drip17.org/home/	es
dc.title.event	17th Conference on Defects (DRIP XVII)	es
dc.description.other	Póster
dc.description.project	Ministerio de Economía, Industria y Competitividad (ENE2014-56069-C4-4-R)	es
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 International