Skip navigation
Please use this identifier to cite or link to this item: http://uvadoc.uva.es/handle/10324/35190
Title: High resolution LBIC characterization of defects in mc-Si solar cells [Poster]
Authors: Sánchez, L.A.
Moretón Fernández, Ángel
Guada, M.
Rodríguez Conde, S.
Martínez Sacristán, Óscar
González Rebollo, Miguel Angel
Jiménez López, Juan
Conference: 17th Conference on Defects (DRIP XVII)
Issue Date: 2017
Citation: 17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain
Abstract: Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal resolution using the Light-Beam Induced Current (LBIC) technique combined with a ELi - PLi system.
Sponsor: Ministerio de Economía, Industria y Competitividad (ENE2014-56069-C4-4-R)
Note: Póster
Publisher Version: http://drip17.org/home/
Language: eng
URI: http://uvadoc.uva.es/handle/10324/35190
Rights: info:eu-repo/semantics/openAccess
Appears in Collections:DEP32 - Comunicaciones a congresos, conferencias, etc.

Files in This Item:
File Description SizeFormat 
9_DRIP_High-resolution-LBIC-characterization-Poster.pdf7,93 MBAdobe PDFThumbnail
View/Open

This item is licensed under a Creative Commons License Creative Commons

Suggestions
University of Valladolid
Powered by MIT's. DSpace software, Version 5.5
UVa-STIC