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Items 11-15 di 71

Inhomogeneous HfO2 layer growth at atomic layer deposition

Kasikov, Aarne; Tarre, Aivar; Vinuesa Sanz, Guillermo (2023)
Fabrication, characterization and modeling of TiN/Ti/HfO2/W memristors: programming based on an external capacitor discharge

Jiménez-Molinos, F.; García García, Héctor ; González, M.B.; Dueñas Carazo, Salvador ; Castán Lanaspa, María Helena ; Miranda, E.; Campabadal, F.; Roldán, J.B. (2021)
Semiempirical Memdiode Model for Resistive Switching Devices in Dynamic Regimes

Santa Cruz González, C.; Sahelices Fernández, Benjamín ; Jiménez López, Juan Ignacio ; González Ossorio, Óscar ; Castán Lanaspa, María Helena ; González, M.B.; Vinuesa Sanz, Guillermo ; Dueñas Carazo, Salvador ; Campabadal, F.; García García, Héctor (2021)
Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map

Picos, Rodrigo; Stavrinides, Stavros G.; Al Chawa, Mohamad Moner; de Benito, Carola; Dueñas Carazo, Salvador ; Castán Lanaspa, María Helena ; Hatzikraniotis, Euripides; Chua, Leon O. (2022)
An experimental and simulation study of the role of thermal effects on variability in TiN/Ti/HfO2/W resistive switching nonlinear devices

Maldonado, D.; Aguilera-Pedregosa, C.; Vinuesa Sanz, Guillermo ; García García, Héctor ; Dueñas Carazo, Salvador ; Castán Lanaspa, María Helena ; Aldana, S.; González, M.B.; Moreno, E.; Jiménez-Molinos, F.; Campabadal, F.; Roldán, J.B. (2022)