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    Por favor, use este identificador para citar o enlazar este ítem:https://uvadoc.uva.es/handle/10324/58941

    Título
    Programming pulse width assessment for reliable and low-energy endurance performance in Al:HfO2-Based RRAM arrays
    Autor
    Pérez, Eduardo
    González Ossorio, ÓscarAutoridad UVA
    Dueñas Carazo, SalvadorAutoridad UVA Orcid
    Castán Lanaspa, María HelenaAutoridad UVA Orcid
    García García, HéctorAutoridad UVA Orcid
    Wenger, Christian
    Año del Documento
    2020
    Editorial
    MDPI
    Descripción
    Producción Científica
    Documento Fuente
    Electronics, 2020, vol. 9, n.5, 864
    Zusammenfassung
    A crucial step in order to achieve fast and low-energy switching operations in resistive random access memory (RRAM) memories is the reduction of the programming pulse width. In this study, the incremental step pulse with verify algorithm (ISPVA) was implemented by using different pulse widths between 10 μs and 50 ns and assessed on Al-doped HfO2 4 kbit RRAM memory arrays. The switching stability was assessed by means of an endurance test of 1k cycles. Both conductive levels and voltages needed for switching showed a remarkable good behavior along 1k reset/set cycles regardless the programming pulse width implemented. Nevertheless, the distributions of voltages as well as the amount of energy required to carry out the switching operations were definitely affected by the value of the pulse width. In addition, the data retention was evaluated after the endurance analysis by annealing the RRAM devices at 150 °C along 100 h. Just an almost negligible increase on the rate of degradation of about 1 μA at the end of the 100 h of annealing was reported between those samples programmed by employing a pulse width of 10 μs and those employing 50 ns. Finally, an endurance performance of 200k cycles without any degradation was achieved on 128 RRAM devices by using programming pulses of 100 ns width.
    Materias (normalizadas)
    Electrónica
    Electricidad
    RRAM
    Materias Unesco
    3307 Tecnología Electrónica
    3306 Ingeniería y Tecnología Eléctricas
    Palabras Clave
    RRAM arrays
    Programming algorithm
    Pulse width
    Switching energy
    Matrices de RRAM
    Algoritmo de programación
    Ancho de pulso
    Energía de conmutación
    Revisión por pares
    SI
    DOI
    10.3390/electronics9050864
    Patrocinador
    Ministerio de Ciencia e Innovación - FEDER (TEC2017-84321-C4-3-R y MTM2017-88708-P)
    German Research Foundation (DFG) in the frame of research group FOR2093
    Version del Editor
    https://www.mdpi.com/2079-9292/9/5/864
    Propietario de los Derechos
    © 2020 The Authors
    Idioma
    eng
    URI
    https://uvadoc.uva.es/handle/10324/58941
    Tipo de versión
    info:eu-repo/semantics/publishedVersion
    Derechos
    openAccess
    Aparece en las colecciones
    • GCME - Artículos de revista [57]
    • DEP22 - Artículos de revista [65]
    Zur Langanzeige
    Dateien zu dieser Ressource
    Nombre:
    Programming-Pulse-Width-Assessmen.pdf
    Tamaño:
    14.29Mb
    Formato:
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