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Analysis of the performance of Nb2O5-doped SiO2-based MIM devices for memory and neural computation applications

González Ossorio, Óscar

; Vinuesa Sanz, Guillermo; García García, Héctor

; Sahelices Fernández, Benjamín

; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Ritala, Mikko; Leskelä, Markku; Kemell, Marianna; Kukli, Kaupo (2021)

Silicon oxide-niobium oxide mixture films and nanolaminates grown by atomic layer deposition from niobium pentaethoxide and hexakis(ethylamino) disilane

Kukli, Kaupo; Kemell, Marianna; Heikkilä, Mikko J; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Mizohata, Kenichiro; Ritala, Mikko; Leskelä, Markku (2020)

Atomic layer deposition and performance of ZrO2-Al2O3 thin films

Kukli, Kaupo; Kemell, Marianna; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Seemen, Helina; Rähn, Mihkel; Link, Joosep; Stern, Raivo; Heikkilä, Mikko J.; Ritala, Mikko; Leskelä, Markku (2018)

Study of the influence of the dielectric composition of Al/Ti/ZrO2 : Al2O3/TiN/Si/Al structures on the resistive switching behavior for memory applications

Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Kukli, Kaupo; Kemell, Marianna; Ritala, Mikko; Leskelä, Markku (2018)

Atomic layer deposition and properties of HfO2-Al2O3 nanolaminates

Kukli, Kaupo; Kemell, Marianna; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Seemen, Helina; Rähn, Mihkel; Link, Joosep; Stern, Raivo; Ritala, Mikko; Leskelä, Markku (2018)

Admittance memory cycles of Ta2O5-ZrO2-based RRAM devices

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; González Ossorio, Óscar

; Domínguez, Leidy Azucena; García García, Héctor

; Kalam, Kristjan; Kukli, Kaupo; Ritala, Mikko; Leskelä, Markku (2017)