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Now showing items 1-9 of 9

Admittance memory cycles of Ta2O5-ZrO2-based RRAM devices

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; González Ossorio, Óscar

; Domínguez, Leidy Azucena; García García, Héctor

; Kalam, Kristjan; Kukli, Kaupo; Ritala, Mikko; Leskelä, Markku (2017)

A physically based model to describe resistive switching in different RRAM technologies

González-Cordero, G.; González, M.B.; García García, Héctor

; Campabadal, F.; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Jiménez-Molinos, F.; Roldán, J.B. (2017)

Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structures

García García, Héctor

; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; González, M.B.; Acero, M.C.; Campabadal, F. (2017)

A physically based model for resistive memories including a detailed temperature and variability description

González-Cordero, G.; González, M.B.; García García, Héctor

; Campabadal, F.; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Jiménez-Molinos, F.; Roldán, J.B. (2017)

Properties of Zirconium Oxide and Cobalt Ferrite Layered Nanocomposite

Tamm, Aile; Joost, Urmas; Mikkor, Mats; Kalam, Kristjan; Mändar, Hugo; Seemen, Helina; Link, Joosep; Stern, Raivo; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Kukli, Kaupo (2017)

Magnetic and Electrical Performance of Atomic Layer Deposited Iron Erbium Oxide Thin Films

Tamm, Aile; Kalam, Kristjan; Seemen, Helina; Kozlova, Jekaterina; Kukli, Kaupo; Aarik, Jaan; Link, Joosep; Stern, Raivo; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

(2017)

Experimental Observation of Negative Susceptance in HfO2-Based RRAM Devices

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; García García, Héctor

; Ossorio, Oscar G.; Dominguez, Luis A.; Miranda, E. (2017)

RRAM Memories with ALD High-K Dielectrics: Electrical Characterization and Analytical Modeling

Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Sardiña, A.; García García, Héctor

; Arroval, T.; Tamm, A.; Jõgiaas, T.; Kukli, K.; Aarik, J. (2017)

Study of the admittance hysteresis cycles in TiN/Ti/HfO2/W-based RRAM devices

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; García García, Héctor

; Miranda, E.; González, M.B.; Campabadal, F. (2017)