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Effect of dielectric thickness on resistive switching polarity in TiN/Ti/HfO2/Pt stacks

Vinuesa Sanz, Guillermo

; García García, Héctor

; Bargalló González, Mireia; Kalam, Kristjan; Zabala, Miguel; Tarre, Aivar; Kukli, Kaupo; Tamm, Aile; Campabadal Segura, Francesca; Jiménez López, Juan Ignacio

; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

(2022)

Memory effects in nanolaminates of hafnium and iron oxide films structured by atomic layer deposition

Kalam, Kristjan; Otsus, Markus; Kozlova, Jekaterina; Tarre, Aivar; Kasikov, Aarne; Rammula, Raul; Link, Joosep; Stern, Raivo; Vinuesa Sanz, Guillermo

; Lendínez Sánchez, José Miguel; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Tamm, Aile; Kukli, Kaupo (2022)

Hafnium oxide/graphene/hafnium oxide-stacked nanostructures as resistive switching media

Kahro, Tauno; Tarre, Aivar; Käämbre, Tanel; Piirsoo, Helle-Mai; Kozlova, Jekaterina; Ritslaid, Peeter; Kasikov, Aarne; Jõgiaas, Taivo; Vinuesa Sanz, Guillermo

; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Tamm, Aile; Kukli, Kaupo (2021)

Structure and behavior of ZrO2-graphene-ZrO2 stacks

Kahro, Tauno; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Merisalu, Joonas; Kozlova, Jekaterina; Jõgiaas, Taivo; Piirsoo, Helle-Mai; Kasikov, Aarne; Ritslaid, Peeter; Mändar, Hugo; Tarre, Aivar; Tamm, Aile; Kukli, Kaupo (2020)