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The role of defects in the resistive switching behavior of Ta2O5-TiO2-based metal–insulator–metal (MIM) devices for memory applications

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; García García, Héctor

; González Ossorio, Óscar

; Domínguez, Leidy Azucena; Seemen, Helina; Tamm, Aile; Kukli, Kaupo; Aarik, J. (2018)

Resistive switching properties of atomic layer deposited ZrO2-HfO2 thin films

González Ossorio, Óscar

; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Tamm, Aile; Kalam, Kristjan; Seemen, Helina; Kukli, Kaupo (2018)

Atomic layer deposition and performance of ZrO2-Al2O3 thin films

Kukli, Kaupo; Kemell, Marianna; Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Seemen, Helina; Rähn, Mihkel; Link, Joosep; Stern, Raivo; Heikkilä, Mikko J.; Ritala, Mikko; Leskelä, Markku (2018)

Study of the influence of the dielectric composition of Al/Ti/ZrO2 : Al2O3/TiN/Si/Al structures on the resistive switching behavior for memory applications

Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; Kukli, Kaupo; Kemell, Marianna; Ritala, Mikko; Leskelä, Markku (2018)

Memory maps : Reading RRAM devices without power consumption

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Kukli, Kaupo; Mikkor, Mats; Kalam, Kristjan; Arroval, T.; Tamm, Aile (2018)

Atomic layer deposition and properties of ZrO2/Fe2O3 thin films

Kalam, Kristjan; Seemen, Helina; Ritslaid, Peeter; Rähn, Mihkel; Tamm, Aile; Kukli, Kaupo; Kasikov, Aarne; Link, Joosep; Stern, Raivo; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; García García, Héctor

(2018)

Capacitance Spectroscopy for MOS Systems

Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

(2018)

Analysis and control of the intermediate memory states of RRAM devices by means of admittance parameters

Castán Lanaspa, María Helena

; Dueñas Carazo, Salvador

; García García, Héctor

; González Ossorio, Óscar

; Domínguez, Leidy Azucena; Sahelices Fernández, Benjamín

; Miranda, E.; González, M. B.; Campabadal Segura, Francesca (2018)

Electric and magnetic properties of atomic layer deposited ZrO2-HfO2 thin films

Kalam, Kristjan; Seemen, Helina; Mikkor, Mats; Ritslaid, Peeter; Stern, Raivo; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Tamm, Aile; Kukli, Kaupo (2018)

Properties of atomic layer deposited nanolaminates of zirconium and cobalt oxides

Seemen, Helina; Rähn, Mihkel; Kalam, Kristjan; Sajavaara, Timo; Dueñas Carazo, Salvador

; Castán Lanaspa, María Helena

; Link, Joosep; Stern, Raivo; Kukli, Kaupo; Tamm, Aile (2018)

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