Total Visits

Views
Simulación de imágenes de defectos intrínsecos en Silicio mediante microscopía electrónica777

File Visits

Downloads
TFM-G179.pdf281

Select a period of time:

ViewsDownloads

Number of views in the range

Views
Simulación de imágenes de defectos intrínsecos en Silicio mediante microscopía electrónica189

Number of downloads in the range

Downloads
TFM-G179.pdf39

Views

Views
August 202533
September 202536
October 202523
November 202534
December 202536
January 202622
February 20265
Download CSV file
 
Bar graph
 
Line graph

Number of downloads in the period of time

  • Downloads
  • August 2025
    8
  • September 2025
    2
  • October 2025
    3
  • November 2025
    17
  • December 2025
    2
  • January 2026
    5
  • February 2026
    2
 
Bar graph
 
Line graph

Top country views

Views
United States58
China44
Brazil19
Spain15
Vietnam5
Singapore5
United Kingdom4
Germany4
France3
India3

Top countries by downloads

Downloads
China9
Spain7
United States6
United Kingdom5
Germany3

Top cities views

Views
Shanghai10
Inca8
Madrid5
Ashburn4
Atlanta2
Chicago2
Curitiba2
Guangzhou2
Hanoi2
Ho Chi Minh City2

Top cities by downloads

Downloads
Inca2
Madrid1